Wavelength Dispersive X-Ray Fluorescence Spectrometer

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Availablity: In stock
Catalog/Part Number: XRF-1800
Brand: SHIMADZU
Supplier: SHIMADZU
Supplier Location: JAPAN
Inventory Weight: unavailable
Unit of Measurement:
Inventory Brochure: 1567676980.pdf |

Catalog/Part Number:: XRF-1800

Description

Utilizing state-of-the-art technology, including enhanced local analysis technology, originally pioneered by Shimadzu in 1994, in conjunction with superb basic functions, the Lab Center XRF-1800 delivers exceptional reliability, stability, and sensitivity. With complete control, analysis and reporting software, the XRF-1800 is a powerful tool for applications in a range of industries, including electronics, petroleum, chemicals, environmental, and food.

FEATURES

World´s First 250µm Mapping

Patented by Shimadzu, this local analysis technology allows easy data comparison, and enables content distribution and intensity distribution analyses of non-uniform samples. An optional CCD camera provides enhanced observation.


Qualitative/Quantitative Analysis Using Higher-order X-Rays This patented technique enables: Simultaneous measurement of the normal first-order X-ray profile and the higher order X-ray profile More accurate evaluation of higher-order X-rays Independent or superimposed display during off-line data processing of the first-order X-ray profile and the higher order X-ray profile Film Thickness Measurement and Inorganic Component Analysis For high-polymer thin films using the background FP method (patented). Patented Sample Loading System – Eliminates transport problems
Ultra-fast Scanning (300°/min)
With simple operations and the ultra-fast function, easy qualitative/quantitative analysis is rapidly achieved.
Ease of Use
Templates and comprehensive matching functions simplify condition settings and analysis.
Superb Design/Functionality
Designed to meet a variety of analytical needs, the XRF-1800´s design include:
New optical system
4 kW Thin-window X-ray Tube – Installed as standard, it enhances sensitivity for all elements; compared with a conventional 3 kW tube, sensitivity is more than doubled for light elements
Five Types of Primary X-ray Filters
Accurate Temperature Control
Vacuum Stabilizer
Continuous Monitoring System – Ensures easy maintenance

Catalog/Part Number: XRF-1800 Category:

Technical Specifications


X-ray Tube 
4 kW, thin-window, Rh target, end-window construction 
Control Method

Fully computer controlled

Automatic aging

Programmable for automatic start-up and shutoff 

Method of Heat Exchange
Dual-tube cooling water circulation
Cooling Water
Purified with built-in ion exchange resin
Sample Compartment
X-ray irradiation from above the sample Sample rotation at 60 rpm (50/60 Hz) Direction of rotation: set either direction (1-degree units)
Detector

Scintillation counter (SC) for heavy elements

Proportional counter (FPC) for light elements

Aluminum deposited 0.6 µm thick film window Cartridge type filament

Goniometer

θ, 2θ independent drive system

Scanning angle range: SC: 0° to 118° (2θ)

                                          PC: 7° to 148° (2θ) 2θ

scanning speed

Maximum speed: 1200°/min.

Continuous scanning speed: 0.1° to 300°/min.

Step scanning: 0.002° to 1.0°

Stopping position repeatability: ±0.0003°max

Detector High Voltage Supply

500 to 1,000 V for SC

1,500 - 2,500 V for FPC

Pulse Height Analyzer
θ-2θ, PHA operation, peak shift correction, automatic PHA adjustment, dead-time correction


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