Energy Dispersive X-ray Fluorescence Spectrometer for RoHS/ELV Screening

Availablity: EXW

Catalog/Part Number: EDX-LE Plus
Brand: SHIMADZU
Supplier: SHIMADZU
Supplier Location: JAPAN
Inventory Weight: 60 kg
Unit of Measurement:
Inventory Brochure: | EDX-LE_PLUS.pdf |

Catalog/Part Number:: EDX-LE Plus

Description

This expanded model for RoHS/ELV screening is equipped with EDX-Navi, the simple analysis software popular with the EDX-LE series. In addition, it provides high counting rate and high resolution, and also supports general analyses.

Features

1) High Sensitivity and High Accuracy

This model is equipped with an SDD detector, so it can measure the 5 elements restricted by

RoHS directive faster than the EDX-LE.

2) Equipped with the Easy to Operate Software Optimal for Screening, Suitable Even for First-Time

User, compatible with Windows 10 (32-bit or 64-bit)

This model is equipped with easy to operate software (PCEDX-Navi), which is optimal for

screening for hazardous elements specified by the RoHS/ELV directives. The number of mouse

clicks required has been substantially reduced in comparison to conventional software. In

addition, parts that to date have been left to the discretion of the user are now automated, making

this software user friendly from the perspective of the operator

3) Large Sample Chamber

A large sample chamber (W370x320xH155 mm) has been adopted, which can accommodate

a variety of sample forms and sizes: solids, liquids or powders.


https://shimadzugroup.sharepoint.com/sites/gcs/an_sales/Literature/Distributor/ElementalAnalysis/XRF/c142e045a.pdf

Catalog/Part Number: EDX-LE Plus Category:

Technical Specifications


Measurement Principle
X-ray uorescence spectrometry
Measurement Method
Energy dispersive
Elements to be Detected
13Al to 92U
X-Ray Tube
Rh target 
Tube Voltage
5 kV to 50 kV
Primary Filter
Automatic switching between: 5 types + OPEN 
Type
Silicon-drift detector (SDD)
LN2 Supply
Not required
Measurement Atmosphere
Air
Sample Observation 
CCD camera 


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