Energy Dispersive X-ray Fluorescence Spectrometer

Availablity: EXW

Catalog/Part Number: EDX-7000/8000/8100
Brand: SHIMADZU
Supplier: SHIMADZU
Supplier Location: JAPAN
Inventory Weight: 45 kg
Unit of Measurement:
Inventory Brochure: 1567675499.pdf |

Catalog/Part Number:: EDX-7000/8000/8100

Description

The EDX-7000/8000/8100 offers a high level of accuracy and speed in analyzing elements contained in various samples.

FEATURES

Unrivaled Analytical Performance,High Sensitivity − Lower Limit of Detection Improved 1.5 to 5 Times! High Speed − Throughput Increased by up to a Factor of 10 −,High Resolution, No Liquid Nitrogen Required Ultra-Light Element Analysis by EDX-8000/8100,Extremely Flexible Sample Observation Camera and Collimators Automatic Replacement of Five Primary Filters Freely Combine Collimators and Primary Filters Optional Vacuum Measurement Unit and Helium Purge Unit Advanced Helium Purge Unit (Option) 12-Sample Turret (Option) FUNCTIONS Comprehensive Quantitation Functions Functions to Enhance Usability Various Data Output Formats APPLICATION Electrical/electronic materials
RoHS and halogen screening
Thin-film analysis for semiconductors, discs, liquid crystals, and solar cells
– Automobiles and machinery
ELV hazardous element screening
Composition analysis, plating thickness measurement, and chemical conversion coating film weight measurement for machine parts
– Ferrous/non-ferrous metals
Main component analysis and impurity analysis of raw materials, alloys, solder, and precious metals
Composition analysis of slag
– Mining
Grade analysis for mineral processing
– Ceramics
Analysis of ceramics, cement, glass, bricks, and clay
– Oil and petrochemicals
Analysis of sulfur in oil

Analysis of additive elements and mixed elements in lubricating oil
– Chemicals
Analysis of products and organic/inorganic raw materials
Analysis of catalysts, pigments, paints, rubber, and plastics
– Environment
Analysis of soil, effluent, combustion ash, filters, and fine particulate matter
– Pharmaceuticals
Analysis of residual catalyst during synthesis
Analysis of impurities and foreign matter in active pharmaceutical ingredients
– Agriculture and foods
Analysis of soil, fertilizer, and plants
Analysis of raw ingredients, control of added elements, and analysis of foreign matter in foods
– Other
Composition analysis of archeological samples and precious stones, analysis of toxic heavy metals in toys and everyday goods


https://shimadzugroup.sharepoint.com/sites/gcs/an_sales/Literature/Distributor/ElementalAnalysis/XRF/c142e044c.pdf

Catalog/Part Number: EDX-7000/8000/8100 Category:

Technical Specifications


Measurement principle
X-ray fluorescence spectrometry
Measurement method
Energy dispersion
Target samples
Solids, liquids, powders
Measuring range
11Na to 92U (EDX-7000) 6C to 92U (EDX-8000/8100)
X-ray tube
Rh target 
Detector Type
Silicon drift detector (SDD)
Liquid nitrogen
Not required (electronic cooling)
Measurement atmosphere 
Air, vacuum*1, helium (He)*2
Maximum sample mass
5kg (200g per sample when using turret, Gross mass 2.4kg) 
Cooling method
Air-cooled (with fan)


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