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Availablity: In stock
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Availablity: In stock
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Availablity: In stock
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Availablity: In stock
Energy Dispersive X-ray Fluorescence Spectrometer
Catalog/Part Number:: EDX-7000/8000/8100
Description
The EDX-7000/8000/8100 offers a high level of accuracy and speed in analyzing elements contained in various samples.
FEATURES
RoHS and halogen screening
Thin-film analysis for semiconductors, discs, liquid crystals, and solar cells
– Automobiles and machinery
ELV hazardous element screening
Composition analysis, plating thickness measurement, and chemical conversion coating film weight measurement for machine parts
– Ferrous/non-ferrous metals
Main component analysis and impurity analysis of raw materials, alloys, solder, and precious metals
Composition analysis of slag
– Mining
Grade analysis for mineral processing
– Ceramics
Analysis of ceramics, cement, glass, bricks, and clay
– Oil and petrochemicals
Analysis of sulfur in oil
Analysis of additive elements and mixed elements in lubricating
oil
– Chemicals
Analysis of products and organic/inorganic raw materials
Analysis of catalysts, pigments, paints, rubber, and plastics
– Environment
Analysis of soil, effluent, combustion ash, filters, and fine particulate
matter
– Pharmaceuticals
Analysis of residual catalyst during synthesis
Analysis of impurities and foreign matter in active pharmaceutical
ingredients
– Agriculture and foods
Analysis of soil, fertilizer, and plants
Analysis of raw ingredients, control of added elements, and analysis of
foreign matter in foods
– Other
Composition analysis of archeological samples and precious stones, analysis
of toxic heavy metals in toys and everyday goods
Technical Specifications
| Measurement principle | X-ray fluorescence spectrometry |
| Measurement method | Energy dispersion |
| Target samples | Solids, liquids, powders |
| Measuring range | 11Na to 92U (EDX-7000) 6C to 92U (EDX-8000/8100) |
| X-ray tube | Rh target |
| Detector Type | Silicon drift detector (SDD) |
| Liquid nitrogen | Not required (electronic cooling) |
| Measurement atmosphere | Air, vacuum*1, helium (He)*2 |
| Maximum sample mass | 5kg (200g per sample when using turret, Gross mass 2.4kg) |
| Cooling method | Air-cooled (with fan) |
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